JPH0515067B2 - - Google Patents
Info
- Publication number
- JPH0515067B2 JPH0515067B2 JP59275777A JP27577784A JPH0515067B2 JP H0515067 B2 JPH0515067 B2 JP H0515067B2 JP 59275777 A JP59275777 A JP 59275777A JP 27577784 A JP27577784 A JP 27577784A JP H0515067 B2 JPH0515067 B2 JP H0515067B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- probes
- test
- plates
- probe assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27577784A JPS61154137A (ja) | 1984-12-27 | 1984-12-27 | テストプロ−ブ組立体 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27577784A JPS61154137A (ja) | 1984-12-27 | 1984-12-27 | テストプロ−ブ組立体 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61154137A JPS61154137A (ja) | 1986-07-12 |
JPH0515067B2 true JPH0515067B2 (en]) | 1993-02-26 |
Family
ID=17560253
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP27577784A Granted JPS61154137A (ja) | 1984-12-27 | 1984-12-27 | テストプロ−ブ組立体 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61154137A (en]) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0727936B2 (ja) * | 1987-04-21 | 1995-03-29 | 東京エレクトロン株式会社 | プロ−ブカ−ド |
JP2634060B2 (ja) * | 1988-04-28 | 1997-07-23 | 東京エレクトロン株式会社 | プローブ装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5755690Y2 (en]) * | 1979-06-18 | 1982-12-01 | ||
JPS5654096A (en) * | 1979-10-05 | 1981-05-13 | Nippon Electric Co | Device for inspecting printed board |
JPS57115841A (en) * | 1981-01-10 | 1982-07-19 | Nec Corp | Probing method |
JPS58148935U (ja) * | 1982-03-31 | 1983-10-06 | 日本電子材料株式会社 | プロ−ブカ−ド |
JPS58173841A (ja) * | 1982-04-03 | 1983-10-12 | Nippon Denshi Zairyo Kk | プロ−ブカ−ド |
-
1984
- 1984-12-27 JP JP27577784A patent/JPS61154137A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS61154137A (ja) | 1986-07-12 |
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